Get Scanning Transmission Electron Microscopy of Nanomaterials: PDF

By Nobuo Tanaka

ISBN-10: 184816789X

ISBN-13: 9781848167896

The fundamentals, current prestige and destiny customers of high-resolution scanning transmission electron microscopy (STEM) are defined within the type of a textbook for complicated undergraduates and graduate scholars. This quantity covers fresh achievements within the box of STEM received with complex applied sciences reminiscent of round aberration correction, monochromator, high-sensitivity electron power loss spectroscopy and the software program of photograph mapping. the longer term customers bankruptcy additionally offers with z-slice imaging and confocal STEM for 3D research of nanostructured fabrics.

Readership: Graduate scholars and researchers within the box of nanomaterials and nanostructures.

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Download e-book for iPad: Scanning Transmission Electron Microscopy of Nanomaterials: by Nobuo Tanaka

The fundamentals, current prestige and destiny clients of high-resolution scanning transmission electron microscopy (STEM) are defined within the kind of a textbook for complicated undergraduates and graduate scholars. This quantity covers contemporary achievements within the box of STEM bought with complicated applied sciences equivalent to round aberration correction, monochromator, high-sensitivity electron power loss spectroscopy and the software program of snapshot mapping.

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Extra info for Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis

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He ventured to use an imaging method different from conventional TEM (CTEM) using phase contrast for observing single atoms. The possibility of observing single atoms using phase contrast was theoretically discussed by Scherzer (1949), but was not realized at that time. Crewe tried to relate the scattering cross section of atoms to the image intensity in electron microscopes, which is a concept of atomic physics. 3 shows a cross-sectional illustration — 10 — August 1, 2014 10:17 9in x 6in Scanning Transmission Electron Microscopy.

He ventured to use an imaging method different from conventional TEM (CTEM) using phase contrast for observing single atoms. The possibility of observing single atoms using phase contrast was theoretically discussed by Scherzer (1949), but was not realized at that time. Crewe tried to relate the scattering cross section of atoms to the image intensity in electron microscopes, which is a concept of atomic physics. 3 shows a cross-sectional illustration — 10 — August 1, 2014 10:17 9in x 6in Scanning Transmission Electron Microscopy.

In Chapter 7, EELS using STEM and its imaging at an atomic dimension are described from the viewpoint of the “delocalization” of elemental mapping, which is one of the most important topics in the research field. In Chapter 8, the density functional theory for the interpretation of STEMEELS data is described, as well as some applications to actual materials. —6— August 1, 2014 10:17 9in x 6in Scanning Transmission Electron Microscopy. . b1683-ch01 Introduction In Chapter 9, a new technology for aberration correction for STEM imaging and the actions of magnetic lenses are explained.

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Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis by Nobuo Tanaka


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