Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P.'s Atom Probe Microscopy PDF

By Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer

ISBN-10: 1461434351

ISBN-13: 9781461434351

ISBN-10: 146143436X

ISBN-13: 9781461434368

Atom probe microscopy allows the characterization of fabrics constitution and chemistry in 3 dimensions with near-atomic solution. This uniquely strong strategy has been topic to significant instrumental advances during the last decade with the advance of wide-field-of-view detectors and pulsed-laser-assisted evaporation that experience considerably improved the instrument’s services. the sphere is prospering, and atom probe microscopy is being embraced as a mainstream characterization process. This booklet covers all features of atom probe microscopy—including box ion microscopy, box desorption microscopy and a powerful emphasis on atom probe tomography.

Atom Probe Microscopy is geared toward researchers of all event degrees. it's going to give you the newbie with the theoretical historical past and sensible info essential to examine how fabrics paintings utilizing atom probe microscopy innovations. This comprises special motives of the basics and the instrumentation, modern specimen coaching recommendations, experimental info, and an outline of the implications that may be got. The e-book emphasizes approaches for assessing info caliber, and the correct implementation of complex facts mining algorithms. these more matured within the procedure will enjoy the booklet as a unmarried complete resource of vital reference details, tables and methods. either newbie and professional will worth the way in which that Atom Probe Microscopy is decided out within the context of fabrics technology and engineering, and comprises references to key fresh examine results.

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Sample text

Kellogg also reported the evolution of the average charge-state of W ions, and he demonstrated that the experimental data could only be fitted by a model involving multiple-stage post-ionisation of field evaporated ions, whereas neither the charge hopping model or single post-ionisation model could [8]. Subsequently, the relative frequency for each charge-state was calculated by using this model and plotted as a function of the electric field for a significant proportion of the periodic table [9].

Appl. Phys. 48(6), 2618–2625 (1977) 19. J. F. K. Miller, Microsc. Microanal. 5, 930–931 (1999) 20. S. Gipson, J. Appl. Phys. 51(7), 3884–3889 (1980) 21. S. C. Eaton, J. Appl. Phys. 51(10), 5537–5539 (1980) 22. S. W. C. Eaton, J. Phys. D: Appl. Phys. 12(7), 987–996 (1979) 23. B. Gault, D. Haley, F. J. A. P. Geiser, Ultramicroscopy 111 (6), 448–457 (2011) 24. B. Gault, A. P. P. A. Marquis, Ultramicroscopy 110(9), 1215–1222 (2010) 25. M. Huang, A. H. W. Smith, Ultramicroscopy 89(1–3), 163–167 (2001) 26.

3, provides a mean to investigate the depth of the specimen. Provided that the specimen is field evaporated at a constant rate, the in-depth distance between successive images taken at regular time intervals remains constant. Exploiting this principle, the 3D FIM [39] or Computed Field Ion Image Tomography [40] simply involves stacking a sequence of field ion images recorded by a highresolution CCD (charge-coupled device) camera. A tomographic image is ultimately produced, as shown in Fig. 4f, i.

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Atom Probe Microscopy by Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer


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